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The test development process, as applied to In-Circuit (ICT) and Optical testers, must focus not only on the initial design phase, but, equally importantly, on life-cycle management, in order to reduce the recurring costs of test program generation and interface hardware.
The initial design phase generally consists of data import, data edit, and output of the appropriate tester-formatted files. The life cycle management phase begins when the first revision is made to the circuit board. Each revision can impact the soft (test program) and hard (fixture) test assets generated during the initial design phase.
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