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TestSight Developer™ includes Design For Test (DFT) analysis, Probes Placement, Fixture Plate Design, Bead Probe design, and Revision change analysis (Revision Management).
DFT Analysis is used to determine the suitability of a circuit board for In-Circuit test. It provides an instant evaluation of the percentage and spacing of all available probe targets on the circuit board. If probes are already placed, it generates a comprehsive list of probe coverage. If bead probes are used, DFT analysis evaluates the padstack design based on all relevant board data.
Probes Placement matches the characteristics of a candidate target pad on the circuit board with desired characteristics, including type, shape, size, drill size, access settings and mask relief. These characteristics can be programmed into a Macro that will automatically place probes based on the selected criteria, as well as minimum spacing requirements between probes.
Revision Manager provides a layout and value change comparison between two board revisions. Revision manager can provide an instant analysis of whether an existing ICT fixture and test program can be adapted to work with a new circuit board revision, and help determine the necessary design changes.
TestSight Bead Pro is the first software package to provide fully automatic bead probe placement and editing, as well as integrated Paste Stencil and Solder Mask design. TestSight Bead Pro conforms to the design rules specified in the Agilent Medalist Bead Probe Handbook, and provides accurate calculations for the Paste Stencil and Solder Mask size designs.
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