Video Tutorials

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TestSight Overview
Product Registration
Getting Started
BOM Wizard
Probes Placement
Plates Design, Pt. 1
Bead Design & Placement
Bead Stencil Design
Revision Manager, Pt. 1
DFT Analysis
Design for the Agilent 3070
CAD Compare Revision Manager, Pt. 1
CAD Compare DFT Analysis
YESPC - Installation
YESPC - Getting Started
Takaya Test Programmer
TestSight Overview

TestSight Developer is a multi-tester In-Circuit Test (ICT) and flying probe test development environment. It includes tools for loading and editing Computer Aided Design (CAD) files, loading Bill of Materials (BOM) files, placing probes and beads, designing test fixtures, plates and other board test objects, editing devices and printing test files for a variety of printed circuit board (PCB) testers.

For a video tutorial describing the entire TestSight framework and product line, click here.

Getting Started With TestSight Developer

For a video tutorial introducing the TestSight Developer workspace, essential terminology, and navigation and editing shortcuts, click here.

BOM Wizard

The BOM Wizard is a tool for loading Bill Of Materials files and extracting data used to define devices. BOM Wizard works with ASCII data files and can be quickly programmed to parse and extract information from a wide variety of formats.

For a video tutorial on BOM Wizard functionality and use, click here.

Probes Placement

Probe Placement is concerned with accurately placing probes to interconnect the tester to the circuit board. Design goals for this phase include maximum coverage at minimum cost. TestSight Developer places probes using all of the characteristics of a pad, including size, type, mask, proximity to parts and other probes, etc.

For a video tutorial on Probes Placement functionality, click here.

Plates Design

The Plates design capability includes graphical design of all the required plates drill and cutouts, as well as direct output of optimized, NC drill command syntax (Fadal format) that can be loaded directly into the router machine.

For a video tutorial on Plates Design functionality, click here.

Bead Pro

Agilent Medalist Bead Probe Technology is a significant advancement in ICT. Bead Probes provide an alternate method of increasing the number of contact points available for ICT systems. TestSight Bead Pro is a powerful, standalone tool that facilitates all aspects of implementing a Bead Probe strategy. Bead Pro automatically locates optimum bead positions, determines bead size and angles, and generates reports used to design the masks and stencils needed for the beads.

For a video tutorial on Bead Pro functionality, click to view Bead Design & Placement or Bead Stencil Design.

Revision Manager

A Circuit Board Revision is a change in physical layout and parts. This occurs when design changes are made to an existing circuit board. TestSight Developer's Revision Manager functionality provides a process for comparing two circuit boards to determine the differences that will affect existing test programs and fixtures. This can be very useful in determining whether and how to re-use existing test assets.

For a video tutorial on Revision Manager functionality, click here.

For a CAD Compare-specific video tutorial on Revision Manager functionality, click here.

DFT Analysis

TestSight DFT Analysis determines the characteristics of In-Circuit Tester (ICT) probe contact pad targets. Traditional ICT probe pad types include Test Pads, Vias, and Thru-Hole legs. Beads probes are a newer alternative contact option and are also included in the analysis.

For a video tutorial on DFT Analysis functionality, click here.

For a CAD Compare-specific video tutorial on DFT Analysis functionality, click here.

 
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